The topics for the parallel sessions include

Legal Metrology:

• Remote monitoring of measuring instruments
• OIML Session/ R76, R51
• DX/Software/Security
• Activities of international organizations

Scientific Metrology:

• Dissemination of the Redefined Mass Unit,
• Development of balances
• Digital Twin, DCC, and Other topics
• Mass and density metrology
• Weighing instruments and load cell
• Other topics

Applied Metrology:

• Weigh-in-Motion
• AI / Image Recognition
• Automation etc.