Conference Schedule

Conference Schedule

The topics for the parallel sessions include

Legal Metrology:

OIML R76, R51, D31, remote verification, reverification etc.


Scientific Metrology:

Redefinition of SI, Test Method, Digitalization


Applied Metrology:

Image recognition, smart agriculture, storage management by data and more!



 
Contact

Samuel Schmidt

Tel.: +32 2 706 82 15

E-Mail: samuel.schmidt@cecip.eu